NXT GmbH
About us
For over three decades, NXT's high-precision spectrometric measuring systems have been supporting industrial companies all over the world to meet exacting quality standards and increase production efficiency at the same time.
We are convinced that only with the help of precise measurement data can manufacturers consistently meet their tight tolerance targets to achieve production excellence.
That’s why we support them with our team of skilled experts, backed by our customizable measuring devices and specialized software, to analyse and optimize their production processes.
Our innovative solutions offer actionable insights to detect deviations where they occur, whether in dynamic production environments or controlled laboratory settings.
NXT’s competence spans a diverse range of industries, including:
• Renewable Energy (solar wafer, lithium battery)
• Automotive (coatings, glass)
• Consumer Products (displays, foils, varnishes)
• Mechanical Engineering (wires, semiconductors)
• Healthcare (vials, syringes)
and many more.
Address
Borsigstraße 78
52525 Heinsberg
Germany
E-mail: lia.hauschke@nxt91.com
Phone: +49 173 1590024
Internet: www.nxt91.com/
Borsigstraße 78
52525 Heinsberg
Germany
E-mail: lia.hauschke@nxt91.com
Phone: +49 173 1590024
Internet: www.nxt91.com/
Contact person:
Products & Services
SOLAR:
Our Helios INLINE product range has been developed to help you produce high-performance solar panels. With our spectrometric inline measuring systems Helios you can recognize deviations in your solar wafer production process where they occur:
Control of texturing and etching processes
Control of various coatings on silicon-based wafers
Control of poly-Si coatings on TOPCon wafers
Non-contact, software controlled and individually configurable - for the efficiency and reliability of your solar cells.
LITHIUM BATTERY:
Our Volta products have been developed to help you produce high-performance lithium-ion batteries. With our spectrometric inline measuring systems you can recognize deviations in your lithium battery cell production process where they occur:
measure the thickness of insulation layers
for wet and dry film
non-destructive
with a measuring speed of 2ms
Non-contact, software controlled and individually configurable - for the safety and long service life of your lithium batteries. Precise results for a reliable process.
Helios-r8: Coating control of poly-Si coating on TOPCon solar wafers
The Helios-r8 systems are specifically designed for controlling poly-Si coatings on the rear side of TOPCon solar wafers. They provide precise measurements of layer thickness and optical constants (n&k), which are essential for ensuring high-quality selective backside passivation contacts.
The INLINE-r8 system is optimized for high-speed measurements on moving wafers within production environments. It remains stable and accurate even with fluctuations in wafer rotation, distance, or tilt – making it highly reliable for inline quality control.
The OFFLINE-r8 configurations deliver precise measurements for both production and laboratory use. They feature integrated reference samples and offer either motorized scanning (SCAN-r8) or manual operation (LAB-r8), supporting process development and detailed sample inspection.
Helios-tn: Control of coating processes on silicon-based solar wafers
The Helios-tn systems are ideally suited for monitoring and controlling coating processes on silicon-based solar wafers. They offer highly precise measurements of layer thickness and optical constants (n&k) across single and multiple layers, with the ability to measure 2 – 3 parameters simultaneously.
The INLINE-tn system is designed for real-time measurements within production environments. It features tunable optics that adapt to the surface structures of the wafers, ensuring consistent and accurate inline performance.
The OFFLINE-tn systems provide flexibility for research, process development, and sample inspection.
These configurations include motorized x-y mapping (SCAN-tn) or manual operation (LAB-tn) for detailed analysis of wafer surfaces.
Helios-rc: Control of the texturing and etching processes of solar wafers
Helios-rc systems are designed for precise monitoring and control of texturing and etching processes on solar wafers. These systems measure the total reflectance of the textured front side and the spatial angle reflectance of the back side of the wafer to ensure optimal surface treatment. Additionally, they can measure the thickness of thin layers on either the front or back of the wafer, supporting comprehensive surface analysis.
The INLINE-rc system is built for seamless integration
into production environments. It supports measurements on moving wafers, features adjustable working distances, and includes motorized reference samples to ensure accuracy and repeatability during continuous operation.
The OFFLINE-rc systems are ideal for sample inspection and process development. Configurations include motorized
scanning (SCAN-rc) and manual operation (LAB-rc), both equipped with integrated reference standards to ensure long-term measurement stability.
Volta INLINE IL-D / IL-W: Control dry or wet films without referencing
The Volta INLINE IL-W continuously measures the wet film thickness of insulation layers in the electrode production of lithium batteries directly after wet film application. It measures wet films without the need for referencing, making it very easy to integrate.
The system can be configured with multiple measuring heads, each head either static or motorized scanning. For optimal measurement quality and installation flexibility, mechanical fine adjusters enable manual adjustment of the position, working distance and inclination when installing the measuring heads.
The motorized scanning measuring head enables profile scans of the insulating layer and the measurement of two adjacent coating strips with a single head using a swivel motion.
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The Volta INLINE IL-D continuously measures the dry film thickness of insulation layers in the electrode production of lithium batteries directly after the drying oven. It measures dry films without the need for referencing, making it very easy to integrate.
The system can be configured with multiple measuring heads, each head either static or motorized scanning. For optimal measurement quality and installation flexibility, mechanical fine adjusters enable manual adjustment of position, working distance and tilt when installing the measuring heads.
The motorized scanning measuring head enables profile scans of the insulating layer and the measurement of two adjacent coating strips with a single head using a swivel motion.
Volta LITE IL-D: Control the thickness of the dry layers of the film insulation
The Volta LITE IL-D is designed for use in the laboratory, process development and sample testing in production. It measures the dry film thickness of insulation layers with high precision.
The spacious, open sample table makes it easy to measure both very small and large samples.
The system has an integrated PC for data processing and analysis.
