LayTec AG
Booth number: C8120
www.laytec.de
About us
LayTec, founded 1999 in Berlin, is a major provider of in-situ and in-line optical metrology for thin-film processes and PV encapsulation quality control. LayTec‘s InspiRe metrology system monitors all relevant perovskite formation processes in-situ by reflectance spectroscopy. Ideally, it can be complemented by LayTec‘s spectral or time-resolved photoluminescence metrology system PearL, which can be applied in-situ or in-line. Both systems can also be used for monitoring degradation. For encapsulation testing, LayTec provides non-destructive metrology system for lamination process control as well as further solutions for polymer testing.
Address
Seesener Str. 10-13
10709 Berlin
Germany
E-mail: info@laytec.de
Phone: +49 30 89005050
Internet: www.laytec.de
Contact person:
Dr. Madeleine Justianto
Sales Manager
E-mail: madeleine.justianto@laytec.de
Phone: +49 30 8900550
Products & Services
LayTec offers metrology solutions particularly designed for critical processes in the production processes of photovoltaic (PV) modules. For crystalline photovoltaics, we focus on the quality control of the module encapsulation processes whereas for thin film PV, practically all frontend deposition processes can be controlled by applying either in-situ or in-line optical metrology methods. The latter can also be applied in the currently emerging field of tandem PV devices composed of either two thin film devices (e.g. CIGS and perovskites) or on a combination of silicon and perovskite solar cells.
PearL
spectral photoluminescence for in-situ and in-line integration during thin-film deposition for composition analysis
tPearL
time-resolved PL for in-situ and in-line integration for thin-film charge carrier lifetime determination
