NXT AG
Booth number: C8313
www.nxt91.com
About us
For over three decades, NXT's high-precision spectrometric measuring systems have been supporting industrial companies all over the world to meet exacting quality standards and increase production efficiency at the same time.
We are convinced that only with the help of precise measurement data can manufacturers consistently meet their tight tolerance targets to achieve production excellence.
That’s why we support them with our team of skilled experts, backed by our customizable measuring devices and specialized software, to analyse and optimize their production processes.
Our innovative solutions offer actionable insights to detect deviations where they occur, whether in dynamic production environments or controlled laboratory settings.
NXT’s competence spans a diverse range of industries, including:
• Renewable Energy (solar wafer, lithium battery)
• Automotive (coatings, glass)
• Consumer Products (displays, foils, varnishes)
• Mechanical Engineering (wires, semiconductors)
• Healthcare (vials, syringes)
and many more.
Let’s explore how we can unlock new possibilities for your production processes, drive continuous improvement and achieve your efficiency goals.
Our team of experts is ready to offer tailored guidance and solutions – get in touch with us today!
Address
Borsigstraße 78
52525 Heinsberg
Germany
E-mail: lia.requadt@nxt91.com
Phone: +49 2452 9600110
Internet: www.nxt91.com
Products & Services
NXT AG develops and manufactures fast high-precision spectrometric measurement systems for industrial and laboratory applications. For photovoltaics, NXT provides inline and offline metrology solutions known as Helios systems that help manufacturers monitor wafer texturing, reflectance, and coatings to support stable, efficient solar-cell production. Helios systems are reflectometers and polarimeters that are used for quality control of non-homogeneous coatings on the solar wafers:
Control of texturing and etching processes
Control of various coatings on silicon-based wafers
Control of poly-Si coatings on TOPCon wafers
Additionally, NXT manufactures spectroscopic metrology solutions known as Volta systen for Lithium-Ion Battery production:
Inspection of thin layers and insulation layers
Helios-rc
Texturing and etching control
Helios-rc is designed for monitoring and optimising solar-wafer texturing and etching processes. It measures front-side total reflectance, rear-side angular reflectance, and—on coated wafers—colour and coating thickness, enabling reliable surface-quality control. Available in inline and offline configurations.
Helios-tn
Coating-process control
Helios-tn provides precise inline or offline characterisation of functional coatings on silicon-based solar wafers. It measures layer thickness and optical constants n and k for single or multilayer stacks, supporting the control of coatings such as SiNₓ, AlOₓ, SiOₓ, TCO, ITO, and AZO.
Helios-r8
TOPCon poly-Si coating control
Helios-r8 is purpose-built for process and quality control of poly-Si coatings in TOPCon solar-cell production. The system measures poly-Si layer thickness and optical constants on top of the thin tunnelling-oxide layer, helping manufacturers maintain stable and consistent TOPCon coating processes.
Volta
Inspection of insulation layers and thin layers in battery production
Volta is designed for monitoring and optimising the application of insulation and other thin layers in lithium-ion battery production. It measures layer thickness and spectral reflectance on wet or dry films, enabling early detection of coating deviations and reliable quality control.
