For controlling poly-Si coatings on TOPCon solar wafers

• INLINE compact system for your production line or OFFLINE table-top system,
  motorized scanning or manual operation

• Light measurement with 8 individual fibers in a specific angle range
  to determine the reflectance ( r )

– Measures:

1. Spectral values (lambda range: VIS: 380 – 1050 nm)

2. Layer thickness per layer material Poly-Si: 50 – 450 nm

3. Refractive index n&k per layer material Poly-Si: 3.0 - 4.5

– Measuring speed per point: ≤ 200 ms

– Measuring spot size (round): approx. 20 mm

– Working distance to the solar wafer: approx. 17 mm