The Helios-r8 systems are specifically designed for controlling poly-Si coatings on the rear side of TOPCon solar wafers. They provide precise measurements of layer thickness and optical constants (n&k), which are essential for ensuring high-quality selective backside passivation contacts.

The INLINE-r8 system is optimized for high-speed measurements on moving wafers within production environments. It remains stable and accurate even with fluctuations in wafer rotation, distance, or tilt – making it highly reliable for inline quality control.

The OFFLINE-r8 configurations deliver precise measurements for both production and laboratory use. They feature integrated reference samples and offer either motorized scanning (SCAN-r8) or manual operation (LAB-r8), supporting process development and detailed sample inspection.